ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,459, issued on June 23, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Test signal circuit for testing a radio frequency r... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,460, issued on June 23. "Apparatus for testing electronic devices" was invented by SeungHyeon Jeong (Chuncheon, South Korea), HunTaek Lee (... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,461, issued on June 23, was assigned to Taiwan Semiconductor Manufacturing Co. Ltd. (Hsinchu, Taiwan). "System for thermal testing a wafer ... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,462, issued on June 23, was assigned to NXP USA Inc. (Austin, Texas). "On-chip fault detection due to malfunctions on chip pins" was invent... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,463, issued on June 23, was assigned to Tektronix Inc. (Beaverton, Ore.). "Split-path multiplexing accessory for a test and measurement ins... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,464, issued on June 23, was assigned to Rohm Co. Ltd. (Kyoto, Japan). "Semiconductor integrated circuit device and vehicle" was invented by... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,465, issued on June 23, was assigned to Tektronix Inc. (Beaverton, Ore.). "Test and measurement instrument accessory with reconfigurable pr... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,466, issued on June 23, was assigned to MACOM Technology Solutions Holdings Inc. (Lowell, Mass.). "Voice coil leaf spring prober" was inven... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,467, issued on June 23, was assigned to Test Research Inc. (Taipei City, Taiwan). "Electrical testing equipment" was invented by Yi Tsao (T... और पढ़ें
ALEXANDRIA, Va., July 15 -- United States Patent no. 12,663,468, issued on June 23, was assigned to NXP B.V. (Eindhoven, Netherlands). "System and method for detecting faults in integrated circuits" ... और पढ़ें